51

Optical Properties of the Interface between Si and Its Thermally Grown Oxide

Year:
1979
Language:
english
File:
PDF, 349 KB
english, 1979
52

Electroreflectance of GaAs and GaP to 27 eV using synchrotron radiation

Year:
1975
Language:
english
File:
PDF, 1.25 MB
english, 1975
54

Spectroscopic ellipsometry—A perspective

Year:
2013
Language:
english
File:
PDF, 3.60 MB
english, 2013
55

Reconstructed (001) Si and Ge Surfaces

Year:
1995
Language:
english
File:
PDF, 265 KB
english, 1995
59

Linearized Third-Derivative Spectroscopy with Depletion-Barrier Modulation

Year:
1972
Language:
english
File:
PDF, 771 KB
english, 1972
61

Strain dependence of effective masses in tetrahedral semiconductors

Year:
1978
Language:
english
File:
PDF, 1.03 MB
english, 1978
62

- alumina by electron energy loss and optical spectroscopies

Year:
1977
Language:
english
File:
PDF, 204 KB
english, 1977
63

Grain-size effects in the parallel-band absorption spectrum of aluminum

Year:
1986
Language:
english
File:
PDF, 1.27 MB
english, 1986
65

calculations

Year:
2011
Language:
english
File:
PDF, 715 KB
english, 2011
67

Transition in Ge: Two Dimensional or Three Dimensional?

Year:
1973
Language:
english
File:
PDF, 335 KB
english, 1973
69

Schottky-barrier electroreflectance of Ge: Nondegenerate and orbitally degenerate critical points

Year:
1975
Language:
english
File:
PDF, 1.67 MB
english, 1975
70

soft-x-ray threshold in Si

Year:
1977
Language:
english
File:
PDF, 355 KB
english, 1977
71

Electric Field Effects in Optical and First-Derivative Modulation Spectroscopy

Year:
1972
Language:
english
File:
PDF, 376 KB
english, 1972
72

crossover

Year:
1995
Language:
english
File:
PDF, 307 KB
english, 1995
73

Effect of surface and nonuniform fields in electroreflectance: Application to Ge

Year:
1978
Language:
english
File:
PDF, 801 KB
english, 1978
74

Analysis of cermet films with large metal packing fractions

Year:
1986
Language:
english
File:
PDF, 527 KB
english, 1986
77

Extended spectroscopy with high-resolution scanning ellipsometry

Year:
1975
Language:
english
File:
PDF, 351 KB
english, 1975
78

Epitaxial Layers

Year:
1995
Language:
english
File:
PDF, 293 KB
english, 1995
80

Optical dielectric response of PdO

Year:
1992
Language:
english
File:
PDF, 339 KB
english, 1992
81

Electroreflectance and ellipsometry of silicon from 3 to 6 eV

Year:
1978
Language:
english
File:
PDF, 1.42 MB
english, 1978
84

Above-bandgap optical anisotropies in cubic semiconductors: A visible–near ultraviolet probe of surfaces

Year:
1985
Language:
english
File:
PDF, 1.06 MB
english, 1985
89

Concurrent use of write-once memory

Year:
2018
Language:
english
File:
PDF, 588 KB
english, 2018
90

High-Resolution Spectroscopy with Reciprocal-Space Analysis

Year:
1999
Language:
english
File:
PDF, 184 KB
english, 1999
91

Linear Optical Properties of Si Surfaces and Nanostructures

Year:
1999
Language:
english
File:
PDF, 130 KB
english, 1999
94

Characterization of AlxGa1—xN-Compound Layers by Reflectance Difference Spectroscopy

Year:
2000
Language:
english
File:
PDF, 183 KB
english, 2000