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51

Effect of Surface-Influenced Order on Thermal Expansivity of Polymer Thin Films

Thompson, C., Saraf, R. F., Jordan-Sweet, J. L.

Journal:

Year:

1997

Language:

english

File:

PDF, 143 KB

english, 1997

52

Voltage-controlled ferromagnetism and magnetoresistance in LaCoO3/SrTiO3 heterostructures

Hu, Chengqing, Park, Keun Woo, Posadas, Agham, Jordan-Sweet, Jean L., Demkov, Alexander A., Yu, Edward T.

Journal:

Journal of Applied Physics

Year:

2013

Language:

english

File:

PDF, 1.99 MB

english, 2013

53

Characterization of substrate/thin-film interfaces with x-ray microdiffraction

Noyan, I. C., Jordan-Sweet, J., Liniger, E. G., Kaldor, S. K.

Journal:

Applied Physics Letters

Year:

1998

Language:

english

File:

PDF, 333 KB

english, 1998

54

[IEEE 2011 11th Annual Non-Volatile Memory Technology Symposium (NVMTS) - Shanghai, China (2011.11.7-2011.11.9)] 2011 11th Annual Non-Volatile Memory Technology Symposium Proceeding - Materials engineering for Phase Change Random Access Memory

Raoux, Simone, Cheng, Huai-Yu, Sandrini, Jury, Li, Jing, Jordan-Sweet, Jean

Year:

2011

Language:

english

File:

PDF, 2.07 MB

english, 2011

55

Synchrotron X-ray scattering techniques for microelectronics-related materials studies

Jordan-Sweet, J. L.

Journal:

IBM Journal of Research and Development

Year:

2000

Language:

english

File:

PDF, 1.51 MB

english, 2000

56

Evolution of strain relaxation in step-graded SiGe/Si structures

Mooney, P. M., Jordan-Sweet, J. L., Chu, J. O., LeGoues, F. K.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 343 KB

english, 1995

57

Morphological stability and specific resistivity of sub-10 nm silicide films of Ni[sub 1−x]Pt[sub x] on Si substrate

Zhang, Zhen, Zhang, Shi-Li, Yang, Bin, Zhu, Yu, Rossnagel, Stephen M., Gaudet, Simon, Kellock, Andrew J., Jordan-Sweet, Jean, Lavoie, Christian

Journal:

Applied Physics Letters

Year:

2010

Language:

english

File:

PDF, 642 KB

english, 2010

58

Dislocation nucleation barrier in SiGe/Si structures graded to pure Ge

P. M. Mooney, F. K. Legoues, J. L. Jordan-sweet

Year:

1994

Language:

english

File:

PDF, 310 KB

english, 1994

59

X-ray diffraction analysis of SiGe/Si heterostructures on sapphire substrates

P. M. Mooney, J. A. Ott, J. O. Chu, J. L. Jordan-sweet

Year:

1998

Language:

english

File:

PDF, 313 KB

english, 1998

60

Relaxed Si0.7Ge0.3 buffer layers for high-mobility devices

Mooney, P. M., Jordan-Sweet, J. L., Ismail, K., Chu, J. O., Feenstra, R. M., LeGoues, F. K.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 306 KB

english, 1995

61

Texture of NiSi films on Si(001), (111), and (110) substrates

Detavernier, C., Jordan-Sweet, J., Lavoie, C.

Journal:

Journal of Applied Physics

Year:

2008

Language:

english

File:

PDF, 1.45 MB

english, 2008

62

Kinetics of Ni[sub 3]Si[sub 2] formation in the Ni[sub 2]Si–NiSi thin film reaction from in situ measurements

Kittl, J. A., Pawlak, M. A., Torregiani, C., Lauwers, A., Demeurisse, C., Vrancken, C., Absil, P. P., Biesemans, S., Detavernier, C., Jordan-Sweet, J., Lavoie, C.

Journal:

Applied Physics Letters

Year:

2007

Language:

english

File:

PDF, 549 KB

english, 2007

63

Observation of a Precursor during the Crystallization of Amorphous Ni

Sutton, M., Yang, Y. S., Mainville, J., Jordan-Sweet, J. L., Ludwig, K. F., Stephenson, G. B.

Journal:

Physical Review Letters

Year:

1989

Language:

english

File:

PDF, 726 KB

english, 1989

64

: Evidence for Anisotropic Pairing

Horn, P. M., Keane, D. T., Held, G. A., Jordan-Sweet, J. L., Kaiser, D. L., Holtzberg, F., Rice, T. M.

Journal:

Physical Review Letters

Year:

1987

Language:

english

File:

PDF, 619 KB

english, 1987

65

Films Using High-Resolution X-Ray Microdiffraction

Eastman, D. E., Stagarescu, C. B., Xu, G., Mooney, P. M., Jordan-Sweet, J. L., Lai, B., Cai, Z.

Journal:

Physical Review Letters

Year:

2002

Language:

english

File:

PDF, 602 KB

english, 2002

66

Electronic structure of polyimide and related monomers: Theory and experiment

Kowalczyk, Steven P., Stafström, Sven, Brédas, J. L., Salaneck, William R., Jordan-Sweet, Jean L.

Journal:

Physical Review B

Year:

1990

Language:

english

File:

PDF, 714 KB

english, 1990

67

Deformation field in single-crystal fields semiconductor substrates caused by metallization features

Noyan, I. C., Wang, P.-C., Kaldor, S. K., Jordan-Sweet, J. L.

Journal:

Applied Physics Letters

Year:

1999

Language:

english

File:

PDF, 519 KB

english, 1999

68

Crystallization properties of materials along the pseudo-binary line between GeTe and Sb

Cheng, Huai-Yu, Raoux, Simone, Jordan-Sweet, Jean L.

Journal:

Journal of Applied Physics

Year:

2014

Language:

english

File:

PDF, 2.48 MB

english, 2014

69

Topographic measurement of electromigration-induced stress gradients in aluminum conductor lines

P. Wang, I. C. Noyan, S. K. Kaldor, J. L. Jordan-sweet, E. G. Liniger, C. Hu

Year:

2000

Language:

english

File:

PDF, 327 KB

english, 2000

70

Phase transitions in Ge–Sb phase change materials

Raoux, Simone, Cabral, Cyril, Krusin-Elbaum, Lia, Jordan-Sweet, Jean L., Virwani, Kumar, Hitzbleck, Martina, Salinga, Martin, Madan, Anita, Pinto, Teresa L.

Journal:

Journal of Applied Physics

Year:

2009

Language:

english

File:

PDF, 1017 KB

english, 2009

71

Domain mapping of a Ca-doped manganite

Turner, Joshua J., Jordan-Sweet, Jean L., Upton, Mary, Hill, John P., Tokura, Yoshinori, Tomioka, Yasuhide, Kevan, Stephen D.

Journal:

Applied Physics Letters

Year:

2008

Language:

english

File:

PDF, 408 KB

english, 2008

72

A cost-effective method for minimizing the sphere-of-confusion error of x-ray microdiffractometers

I. C. Noyan, S. K. Kaldor, P. Wang, J. Jordan-sweet

Year:

1999

Language:

english

File:

PDF, 449 KB

english, 1999

73

Polymer/metal interfaces studied by carbon near-edge x-ray absorption fine structure spectroscopy

Jordan-Sweet, J. L., Kovac, C. A., Goldberg, M. J., Morar, J. F.

Journal:

The Journal of Chemical Physics

Year:

1988

Language:

english

File:

PDF, 768 KB

english, 1988

74

Unique x-ray diffraction pattern at grazing incidence from misfit dislocations in SiGe thin films

J. L. Jordan-sweet, P. M. Mooney, M. A. Lutz, R. M. Feenstra, J. O. Chu, F. K. Legoues

Year:

1996

Language:

english

File:

PDF, 387 KB

english, 1996

75

Materials and electrical characterization of physical vapor deposited La[sub x]Lu[sub 1−x]O[sub 3] thin films on 300 mm silicon

L. F. Edge, T. Vo, V. K. Paruchuri, R. Iijima, J. Bruley, J. Jordan-sweet, B. P. Linder, A. J. Kellock, T. Tsunoda, S. R. Shinde

Year:

2011

Language:

english

File:

PDF, 861 KB

english, 2011

76

Effects of temperature dependent pre-amorphization implantation on NiPt silicide formation and thermal stability on Si(100)

Ozcan, Ahmet S., Wall, Donald, Jordan-Sweet, Jean, Lavoie, Christian

Journal:

Applied Physics Letters

Year:

2013

Language:

english

File:

PDF, 1.45 MB

english, 2013

77

Transient and end silicide phase formation in thin film Ni/polycrystalline-Si reactions for fully silicided gate applications

J. A. Kittl, M. A. Pawlak, C. Torregiani, A. Lauwers, C. Demeurisse, C. Vrancken, P. P. Absil, S. Biesemans, C. Coia, C. Detavernier, J. Jordan-sweet, C. Lavoie

Year:

2007

Language:

english

File:

PDF, 686 KB

english, 2007

78

Instrumentation for millisecond-resolution scattering studies (invited)

G. B. Stephenson, K. F. Ludwig, J. L. Jordan-sweet, S. Brauer, J. Mainville, Y. S. Yang, M. Sutton

Year:

1989

Language:

english

File:

PDF, 665 KB

english, 1989

79

Scanning x-ray microtopographs of misfit dislocations at SiGe/Si interfaces

Mooney, P. M., Jordan-Sweet, J. L., Christiansen, S. H.

Journal:

Applied Physics Letters

Year:

2001

Language:

english

File:

PDF, 336 KB

english, 2001

80

Manipulating stress in Cu/low-k dielectric nanocomposites

Murray, Conal E., Besser, Paul R., Ryan, E. Todd, Jordan-Sweet, Jean L.

Journal:

Applied Physics Letters

Year:

2011

Language:

english

File:

PDF, 466 KB

english, 2011

81

Divergence effects in monochromatic x-ray microdiffraction using tapered capillary optics

Noyan, I. C., Wang, P.-C., Kaldor, S. K., Jordan-Sweet, J. L., Liniger, E. G.

Journal:

Review of Scientific Instruments

Year:

2000

Language:

english

File:

PDF, 469 KB

english, 2000

82

films on Si(001)

Detavernier, C., Lavoie, C., Jordan-Sweet, J., Özcan, A. S.

Journal:

Physical Review B

Year:

2004

Language:

english

File:

PDF, 1.81 MB

english, 2004

83

Influence of a transient hexagonal phase on the microstructure and morphological stability of NiSi films

C. Van Bockstael, K. De Keyser, R. L. Van Meirhaeghe, C. Detavernier, J. L. Jordan-sweet, C. Lavoie

Year:

2009

Language:

english

File:

PDF, 563 KB

english, 2009

84

Boron migration due to annealing in CoFeB/MgO/CoFeB interfaces: A combined hard x-ray photoelectron spectroscopy and x-ray absorption studies

Rumaiz, Abdul K., Jaye, C., Woicik, J. C., Wang, Weigang, Fischer, D. A., Jordan-Sweet, J., Chien, C. L.

Journal:

Applied Physics Letters

Year:

2011

Language:

english

File:

PDF, 520 KB

english, 2011

85

Effects of annealing on the local structure of Fe and Co in CoFeB/MgO/CoFeB tunnel junctions: An extended x-ray-absorption fine structure study

Rumaiz, Abdul K., Woicik, J. C., Wang, W. G., Jordan-Sweet, Jean, Jaffari, G. H., Ni, C., Xiao, John Q., Chien, C. L.

Journal:

Applied Physics Letters

Year:

2010

Language:

english

File:

PDF, 579 KB

english, 2010

86

Crystallization properties of ultrathin phase change films

Raoux, Simone, Jordan-Sweet, Jean L., Kellock, Andrew J.

Journal:

Journal of Applied Physics

Year:

2008

Language:

english

File:

PDF, 867 KB

english, 2008

87

Method to measure the viscosity of nanometer liquid films from the surface fluctuations

Yang, Zhaohui, Lam, Chi-Hang, DiMasi, Elaine, Bouet, Nathalie, Jordan-Sweet, Jean, Tsui, Ophelia K. C.

Journal:

Applied Physics Letters

Year:

2009

Language:

english

File:

PDF, 384 KB

english, 2009

88

In situ characterization of titanium silicide formation: The effect of Mo interlayer, temperature ramp-rate, and annealing atmosphere

Zhang, S.-L., Lavoie, C., Cabral, C., Harper, J. M. E., d’Heurle, F. M., Jordan-Sweet, J.

Journal:

Journal of Applied Physics

Year:

1999

Language:

english

File:

PDF, 1.68 MB

english, 1999

89

Observation of local tilted regions in strain-relaxed SiGe/Si buffer layers using x-ray microdiffraction

Mooney, P. M., Jordan-Sweet, J. L., Noyan, I. C., Kaldor, S. K., Wang, P.-C.

Journal:

Applied Physics Letters

Year:

1999

Language:

english

File:

PDF, 2.41 MB

english, 1999

90

Real-time x-ray microbeam characterization of electromigration effects in Al(Cu) wires

Wang, P.-C., Noyan, I. C., Kaldor, S. K., Jordan-Sweet, J. L., Liniger, E. G., Hu, C.-K.

Journal:

Applied Physics Letters

Year:

2001

Language:

english

File:

PDF, 286 KB

english, 2001

91

Formation and morphological stability of NiSi in the presence of W, Ti, and Ta alloying elements

Deduytsche, D., Detavernier, C., Van Meirhaeghe, R. L., Jordan-Sweet, J. L., Lavoie, C.

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 754 KB

english, 2007

92

Strain relaxation in single crystal SrTiO3 grown on Si (001) by molecular beam epitaxy

Choi, Miri, Posadas, Agham, Dargis, Rytis, Shih, Chih-Kang, Demkov, Alexander A., Triyoso, Dina H., David Theodore, N., Dubourdieu, Catherine, Bruley, John, Jordan-Sweet, Jean

Journal:

Journal of Applied Physics

Year:

2012

Language:

english

File:

PDF, 1.82 MB

english, 2012

93

The crystallization behavior of stoichiometric and off-stoichiometric Ga–Sb–Te materials for phase-change memory

Cheng, Huai-Yu, Raoux, Simone, Jordan-Sweet, Jean L.

Journal:

Applied Physics Letters

Year:

2011

Language:

english

File:

PDF, 566 KB

english, 2011

94

Irreversible altering of crystalline phase of phase-change Ge–Sb thin films

Krusin-Elbaum, L., Shakhvorostov, D., Cabral, C., Raoux, S., Jordan-Sweet, J. L.

Journal:

Applied Physics Letters

Year:

2010

Language:

english

File:

PDF, 624 KB

english, 2010

95

[IEEE 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Shanghai, China (2010.11.1-2010.11.4)] 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology - Phase formation and stability of Ni silicide contacts - scaling to ultra-thin films

Detavernier, C., De Keyser, K., Van Bockstael, C., Jordan-Sweet, J., Lavoie, C.

Year:

2010

Language:

english

File:

PDF, 666 KB

english, 2010

96

In situ x-ray diffraction study of Ni–Yb interlayer and alloy systems on Si(100)

Knaepen, W., Demeulemeester, J., Jordan-Sweet, J., Vantomme, A., Detavernier, C., Van Meirhaeghe, R. L., Lavoie, C.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2010

Language:

english

File:

PDF, 719 KB

english, 2010

97

Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: Applications to texture and defects determination in oriented thin films and nanoprecipitates

Gaudet, Simon, De Keyser, Koen, Lambert-Milot, Samuel, Jordan-Sweet, Jean, Detavernier, Christophe, Lavoie, Christian, Desjardins, Patrick

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2013

Language:

english

File:

PDF, 4.10 MB

english, 2013

98

Triaxial stress distributions in Cu/low-k interconnect features

Murray, Conal E., Besser, Paul R., Ryan, E. Todd, Jordan-Sweet, Jean L.

Journal:

Applied Physics Letters

Year:

2011

Language:

english

File:

PDF, 503 KB

english, 2011

99

Mitigating residual stress in Cu metallization

Murray, Conal E., Jordan-Sweet, Jean, Todd Ryan, E., Toney, Michael F.

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 812 KB

english, 2012

100

X-ray scattering study of the thermal roughening of Ag(110)

Held, G. A., Jordan-Sweet, J. L., Horn, P. M., Mak, A., Birgeneau, R. J.

Journal:

Physical Review Letters

Year:

1987

Language:

english

File:

PDF, 710 KB

english, 1987