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51

The effect of the angle of incidence on secondary ion yields of oxygen-bombarded solids

Journal:

Nuclear Instruments and Methods in Physics Research

Year:

1983

Language:

english

File:

PDF, 333 KB

english, 1983

52

Background formation in SIMS analysis of hydrogen, carbon, nitrogen and oxygen in silicon

Journal:

Nuclear Instruments and Methods in Physics Research

Year:

1983

Language:

english

File:

PDF, 433 KB

english, 1983

53

Production of ions of the opposite charge in mass analysis using a quadrupole filter

Journal:

International Journal of Mass Spectrometry and Ion Processes

Year:

1986

Language:

english

File:

PDF, 865 KB

english, 1986

54

Determination of implantation profiles in solids by secondary ion mass spectrometry

J. Maul, F. Schulz, K. Wittmaack

Journal:

Physics Letters A

Year:

1972

Language:

english

File:

PDF, 139 KB

english, 1972

55

Non-Gaussian range profiles in amorphous solids

K. Wittmaack, F. Schulz, J. Maul

Journal:

Physics Letters A

Year:

1973

Language:

english

File:

PDF, 189 KB

english, 1973

56

Range parameter distortion in heavy ion implantation

P. Blank, K. Wittmaack

Journal:

Physics Letters A

Year:

1975

Language:

english

File:

PDF, 166 KB

english, 1975

57

On the mechanism of cluster emission in sputtering

Journal:

Physics Letters A

Year:

1979

Language:

english

File:

PDF, 367 KB

english, 1979

58

Projectile-energy dependence and line shape of ArL Auger spectra from argon bombarded silicon

Journal:

Physics Letters A

Year:

1979

Language:

english

File:

PDF, 388 KB

english, 1979

59

Secondary ion emission from polymer layers by atomic and molecular ion bombardment: Data evaluation based on linear-cascade sputtering theory

Journal:

Applied Surface Science

Year:

2006

Language:

english

File:

PDF, 209 KB

english, 2006

60

TOF-SIMS characterisation of spark-generated nanoparticles made from pairs of Ir–Ir and Ir–C electrodes

W. Szymczak, N. Menzel, W.G. Kreyling, K. Wittmaack

Journal:

International Journal of Mass Spectrometry

Year:

2006

Language:

english

File:

PDF, 904 KB

english, 2006

61

Gas-phase ionisation of sputtered rare gas atoms

Journal:

International Journal of Mass Spectrometry

Year:

2008

Language:

english

File:

PDF, 772 KB

english, 2008

62

Accurate in situ calibration of the energy bandwidth and the zero-energy offset in SIMS analysis using magnetic sector field instruments

Klaus Wittmaack

Journal:

International Journal of Mass Spectrometry

Year:

2011

Language:

english

File:

PDF, 545 KB

english, 2011

63

Quantitative characterization of xenon bubbles in silicon: Correlation of bubble size with the damage generated during implantation

Klaus Wittmaack, Helmut Oppolzer

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2011

Language:

english

File:

PDF, 809 KB

english, 2011

64

An AES-SIMS study of silicon oxidation induced by ion or electron bombardment

W. Reuter, K. Wittmaack

Journal:

Applications of Surface Science

Year:

1980

Language:

english

File:

PDF, 1.42 MB

english, 1980

65

Implications in the use of reactive ion bombardment for secondary ion yield enhancement

Klaus Wittmaack

Journal:

Applications of Surface Science

Year:

1981

Language:

english

File:

PDF, 1.07 MB

english, 1981

66

Angular dependence of silicon oxide formation and gold segregation due to low-energy O2+ implantation

N. Menzel, K. Wittmaack

Journal:

Materials Science and Engineering: B

Year:

1992

Language:

english

File:

PDF, 416 KB

english, 1992

67

Instrumentation of kinetic spectroscopy-22: Circuitry for driving the injector of an electron accelerator

E. Janata, J. Budnick, H.-J. Wittmaack, J. Porsinger

Journal:

Radiation Physics and Chemistry

Year:

2008

Language:

english

File:

PDF, 154 KB

english, 2008

68

Corium spreading and coolability: CSC Project

G Cognet, H Alsmeyer, W Tromm, D Magallon, R Wittmaack, B.R Sehgal, W Widmann, L De Cecco, R Ocelli, G Azarian, D Pineau, B Spindler, G Fieg, H Werle, C Journeau, M Cranga, G Laffont

Journal:

Nuclear Engineering and Design

Year:

2001

Language:

english

File:

PDF, 670 KB

english, 2001

69

Memory properties of Si+ implanted gate oxides: from MOS capacitors to nvSRAM

J von Borany, T Gebel, K.-H Stegemann, H.-J Thees, M Wittmaack

Journal:

Solid-State Electronics

Year:

2002

Language:

english

File:

PDF, 567 KB

english, 2002

70

Non-volatile memories based on Si+-implanted gate oxides

T. Gebel, J. von Borany, H.-J. Thees, M. Wittmaack, K.-H. Stegemann, W. Skorupa

Journal:

Microelectronic Engineering

Year:

2001

Language:

english

File:

PDF, 170 KB

english, 2001

71

Detailed evaluation of the analytical resolution function

Journal:

Applied Surface Science

Year:

2003

Language:

english

File:

PDF, 137 KB

english, 2003

72

Apparent and real transient effects in SIMS depth profiling using oxygen bombardment

Journal:

Applied Surface Science

Year:

2003

Language:

english

File:

PDF, 180 KB

english, 2003

73

Surface roughening of silicon under ultra-low-energy cesium bombardment

Y. Kataoka, K. Yamazaki, M. Shigeno, Y. Tada, K. Wittmaack

Journal:

Applied Surface Science

Year:

2003

Language:

english

File:

PDF, 235 KB

english, 2003

74

Surprisingly large apparent profile shifts of As and Sb markers in Si bombarded with ultra-low-energy Cs ion beams

Y Kataoka, M Shigeno, Y Tada, K Wittmaack

Journal:

Applied Surface Science

Year:

2003

Language:

english

File:

PDF, 152 KB

english, 2003

75

Time-of-flight secondary ion mass spectrometry of matrix-diluted oligo- and polypeptides bombarded with slow and fast projectiles: positive and negative matrix and analyte ion yields, background signals, and sample aging

Klaus Wittmaack, Wilfried Szymczak, Gerald Hoheisel, Wilfried Tuszynski

Journal:

Journal of the American Society for Mass Spectrometry

Year:

2000

Language:

english

File:

PDF, 481 KB

english, 2000

76

Analysis of Defect Annealing in Monocrystalline Gold Foils after Gold Ion Irradiation

Journal:

physica status solidi (b)

Year:

1970

Language:

english

File:

PDF, 851 KB

english, 1970

77

Effect of water treatment on analyte and matrix ion yields in matrix-assisted time-of-flight secondary ion mass spectrometry: the case of insulin in and on hydroxycinnamic acid

Wilfried Szymczak, Klaus Wittmaack

Journal:

Rapid Communications in Mass Spectrometry

Year:

2002

Language:

english

File:

PDF, 427 KB

english, 2002

78

Peak or centroid — which parameter is better suited for quantifying apparent marker locations in low-energy sputter depth profiling with reactive primary ion beams?

K. Wittmaack, E. Hammerl, I. Eisele, S. B. Patel

Journal:

Surface and Interface Analysis

Year:

2001

Language:

english

File:

PDF, 120 KB

english, 2001

79

Neutralization phenomena observed with secondary ions originating from inner-shell excitation

Klaus Wittmaack

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 223 KB

english, 2011

80

A. Benninghoven, C. A. Evans jr, R. A. Powell, R. Shimizu and R. A. Storms. Secondary ion mass spectrometry: Proceedings of the second international conference on secondary ion mass spectrometry (SIMS II). Springer Series in Chemical Physics, Vol. 9. Springer, Berlin, 1979, xiii + 298 pp., 234 Figs. DM58.00 $34.30 (approx)

Journal:

Surface and Interface Analysis

Year:

1981

Language:

english

File:

PDF, 276 KB

english, 1981

81

Element-Specific broadening effects in SIMS depth profiling of light impurities implanted in silicon

W. Wach, K. Wittmaack

Journal:

Surface and Interface Analysis

Year:

1982

Language:

english

File:

PDF, 366 KB

english, 1982

82

Charge compensation in SIMS analysis of polymer foils using negative secondary ions

Journal:

Surface and Interface Analysis

Year:

1987

Language:

english

File:

PDF, 412 KB

english, 1987

83

Comparison of profile tailing in SIMS analyses of various impurities in silicon using nitrogen, oxygen, and neon ion beams at near-normal incidence

Y. Homma, K. Wittmaack

Journal:

Applied Physics A: Materials Science & Processing

Year:

1990

Language:

english

File:

PDF, 730 KB

english, 1990

84

Raster scanning depth profiling of layer structures

Journal:

Applied Physics A: Materials Science & Processing

Year:

1977

Language:

english

File:

PDF, 637 KB

english, 1977

85

On the number of solutions of a Duffing equation

Melitta Fiebig-Wittmaack

Journal:

Zeitschrift für Angewandte Mathematik und Physik (ZAMP)

Year:

1991

Language:

english

File:

PDF, 414 KB

english, 1991

86

Quantitative analysis of W-C:H coatings by EPMA, RBS (ERD) and SIMS

Peter Willich, Min Wang, Klaus Wittmaack

Journal:

Microchimica Acta

Year:

1994

Language:

english

File:

PDF, 480 KB

english, 1994

87

Messung der Energieverlustspektren von Aluminium- und Silberfolien mit hoher Auflösung

J. Geiger, K. Wittmaack

Journal:

Zeitschrift für Physik A Hadrons and Nuclei

Year:

1966

Language:

german

File:

PDF, 980 KB

german, 1966

88

Wirkungsquerschnitte für die Anregung von Molekülschwingungen durch schnelle Elektronen

J. Geiger, K. Wittmaack

Journal:

Zeitschrift für Physik A Hadrons and Nuclei

Year:

1965

Language:

german

File:

PDF, 506 KB

german, 1965

89

Tiefenverteilung der Anregung charakteristischer Röntgenstrahlung in Kupfer durch 12 bis 30 keV-Elektronen

G. Dürr, W. O. Hofer, F. Schulz, K. Wittmaack

Journal:

Zeitschrift für Physik A Hadrons and Nuclei

Year:

1971

File:

PDF, 582 KB

1971

90

Beiträge zur Kenntniss der Wirkung des Chinins auf das Gehörorgan

Journal:

Pflügers Archiv European Journal of Physiology

Year:

1903

Language:

german

File:

PDF, 1.85 MB

german, 1903

91

Beiträge zur Kenntniss der Wirkung des Chinins auf das Gehörorgan

Journal:

Pflügers Archiv European Journal of Physiology

Year:

1903

Language:

german

File:

PDF, 1.36 MB

german, 1903

92

Eine neue Stütze der Helmholtz'schen Resonanztheorie

Journal:

Pflügers Archiv European Journal of Physiology

Year:

1907

Language:

german

File:

PDF, 425 KB

german, 1907

93

Concept and validation of a novel approach for producing large batches of reference material of ambient aerosols on filters

Journal:

Analytical and Bioanalytical Chemistry

Year:

2005

Language:

english

File:

PDF, 562 KB

english, 2005

94

Evolution of the atmospheric boundary-layer structure of an arid Andes Valley

S. Khodayar, N. Kalthoff, M. Fiebig-Wittmaack, M. Kohler

Journal:

Meteorology and Atmospheric Physics

Year:

2008

Language:

english

File:

PDF, 1010 KB

english, 2008

95

The influence of a storage lake in the Arid Elqui Valley in Chile on local climate

I. Bischoff-Gauß, N. Kalthoff, M. Fiebig-Wittmaack

Journal:

Theoretical and Applied Climatology

Year:

2006

Language:

english

File:

PDF, 2.36 MB

english, 2006

96

Model Simulations of the Boundary-Layer Evolution over an Arid Andes Valley

Inge Bischoff-Gauß, Norbert Kalthoff, Samiro Khodayar, Melitta Fiebig-Wittmaack, Sonia Montecinos

Journal:

Boundary-Layer Meteorology

Year:

2008

Language:

english

File:

PDF, 1.66 MB

english, 2008

97

Deriving the mean primary-particle diameter and related quantities from the size distribution and the gravimetric mass of spark generated nanoparticles

Klaus Wittmaack

Journal:

Journal of Nanoparticle Research

Year:

2007

Language:

english

File:

PDF, 336 KB

english, 2007

98

Deriving the mean primary-particle diameter and related quantities from the size distribution and the gravimetric mass of spark generated nanoparticles

Klaus Wittmaack

Journal:

Journal of Nanoparticle Research

Year:

2007

Language:

english

File:

PDF, 122 KB

english, 2007

99

Improved secondary-ion extraction in a quadrupole-based ion microprobe

K. Wittmaack, M.G. Dowsett, J.B. Clegg

Journal:

International Journal of Mass Spectrometry and Ion Physics

Year:

1982

Language:

english

File:

PDF, 609 KB

english, 1982

100

Low energy range distributions of 10B and 11B in amorphous and crystalline silicon

W. Wach, K. Wittmaack

Journal:

Nuclear Instruments and Methods in Physics Research

Year:

1982

Language:

english

File:

PDF, 296 KB

english, 1982