1

Orientation identification of the power spectrum

Year:
2011
Language:
english
File:
PDF, 3.80 MB
english, 2011
3

Evaluating sharpness functions for automated scanning electron microscopy

Year:
2010
Language:
english
File:
PDF, 1.15 MB
english, 2010
7

Defocus and twofold astigmatism correction in HAADF-STEM

Year:
2011
Language:
english
File:
PDF, 1.96 MB
english, 2011
10

Iterative Autofocus Algorithms for Scanning Electron Microscopy

Year:
2009
Language:
english
File:
PDF, 210 KB
english, 2009