2

A student’s experiment for the determination of the rest energy E0 of electrons

Year:
1979
Language:
english
File:
PDF, 423 KB
english, 1979
15

Quantitative analysis of binary alloys by XPS

Year:
1974
Language:
english
File:
PDF, 361 KB
english, 1974
17

Absolute calibration of an X-ray photoelectron spectrometer

Year:
1976
Language:
english
File:
PDF, 538 KB
english, 1976
20

Evaluation of XPS-data of oxide layers

Year:
1979
Language:
english
File:
PDF, 480 KB
english, 1979
31

Quantitative XPS analysis without reference samples

Year:
1979
Language:
english
File:
PDF, 418 KB
english, 1979
33

Growth of a contamination layer

Year:
1981
Language:
english
File:
PDF, 189 KB
english, 1981
34

Shading at different take-off angles in X-ray photoelectron spectroscopy

Year:
1981
Language:
english
File:
PDF, 310 KB
english, 1981
35

Evaluating ratio data for the determination of reduced thicknesses by XPS

Year:
1981
Language:
english
File:
PDF, 318 KB
english, 1981
40

On the use of an electron spectrometer as detector for soft X-ray spectra

Year:
1975
Language:
english
File:
PDF, 292 KB
english, 1975
41

Multiple ionization in quantitative XRF

Year:
2001
Language:
english
File:
PDF, 84 KB
english, 2001
42

X-ray waveguide phenomenon in thin layers under grazing incidence conditions.

Year:
2001
Language:
english
File:
PDF, 210 KB
english, 2001
48

Surface analysis by TEY — Theory and applications

Year:
1997
Language:
english
File:
PDF, 506 KB
english, 1997
49

Buchbesprechungen

Year:
1998
Language:
german
File:
PDF, 121 KB
german, 1998