51

Random-like testing of very large scale integration circuit

Year:
1998
Language:
english
File:
PDF, 369 KB
english, 1998
57

Reduction of faults in software testing by fault domination

Year:
2007
Language:
english
File:
PDF, 230 KB
english, 2007
59

Poling and properties of nano-composite thin film PT/PEK-C

Year:
1999
Language:
english
File:
PDF, 175 KB
english, 1999
60

The methodology of testability prediction for sequential circuits

Year:
1996
Language:
english
File:
PDF, 780 KB
english, 1996
63

Detecting I/O and Internal Feedback Bridging Faults

Year:
1985
Language:
english
File:
PDF, 1.00 MB
english, 1985
74

Effective model for plasmonic coupling: A rigorous derivation

Year:
2014
Language:
english
File:
PDF, 2.62 MB
english, 2014