54

Single-image Tomography: 3D Volumes from 2D Cranial X-Rays

Year:
2018
Language:
english
File:
PDF, 53.92 MB
english, 2018
57

Atomic Steps on Surfaces

Year:
1989
Language:
english
File:
PDF, 118 KB
english, 1989
59

Atomic Steps on Surfaces

Year:
1989
Language:
english
File:
PDF, 116 KB
english, 1989
60

Atomic Steps on Surfaces

Year:
1989
Language:
english
File:
PDF, 120 KB
english, 1989
63

Kristallisation für die Aufarbeitung von Proteinen

Year:
2004
Language:
german
File:
PDF, 187 KB
german, 2004
66

Eignung von kontinuierlich durchströmten Mischern zum Homogenisieren

Year:
1979
Language:
german
File:
PDF, 934 KB
german, 1979
67

Begasen höherviskoser Flüssigkeiten

Year:
1980
File:
PDF, 1.48 MB
1980
70

Verfahrenstechnische Auslegungsunterlagen für Rührbehälter als Fermenter

Year:
1982
Language:
german
File:
PDF, 1.17 MB
german, 1982
72

Untersuchungen zur Kinetik der aeroben Abwasserreinigung

Year:
1986
Language:
german
File:
PDF, 411 KB
german, 1986
74

Rheologische Stoffeigenschaften – Erklärung, Messung, Erfassung und Bedeutung

Year:
1988
Language:
german
File:
PDF, 754 KB
german, 1988
76

Beanspruchung von Partikeln in Rührreaktoren

Year:
1994
Language:
german
File:
PDF, 470 KB
german, 1994
79

Aspekte der kontinuierlichen Fermentation

Year:
1997
Language:
german
File:
PDF, 138 KB
german, 1997
85

Surface states on clean silicon

Year:
1966
Language:
english
File:
PDF, 249 KB
english, 1966
86

Lattice contraction in silver monolayers

Year:
1987
Language:
english
File:
PDF, 388 KB
english, 1987
87

Growth modes in homo- and heteroepitaxial growth

Year:
1993
Language:
english
File:
PDF, 912 KB
english, 1993
88

Oxygen on cleaved silicon (111): Effects of atomic steps and residual gases

Year:
1980
Language:
english
File:
PDF, 53 KB
english, 1980
90

Epitaxy of Si(111) as studied with a new high resolving LEED system

Year:
1982
Language:
english
File:
PDF, 66 KB
english, 1982
91

Study of self-hydrogenation of ethene on clean Ni(111)

Year:
1983
Language:
english
File:
PDF, 65 KB
english, 1983
92

Spot profile analysis (LEED) of defects at silicon surfaces

Year:
1983
Language:
english
File:
PDF, 52 KB
english, 1983
93

Adsorption of atomic hydrogen on clean cleaved silicon (111)

Year:
1983
Language:
english
File:
PDF, 40 KB
english, 1983
95

Adsorption and desorption of hydrogen and ethene on clean Si (111) faces

Year:
1984
Language:
english
File:
PDF, 52 KB
english, 1984
96

Defects at semiconductor surfaces

Year:
1985
Language:
english
File:
PDF, 47 KB
english, 1985
97

Epitaxial growth of Xe on the Si(111) 7 × 7 surface observed by leed

Year:
1985
Language:
english
File:
PDF, 52 KB
english, 1985
98

A new LEED instrument for quantitative spot profile analysis

Year:
1986
Language:
english
File:
PDF, 54 KB
english, 1986
99

Leed studies of defects at surfaces and interfaces

Year:
1986
Language:
english
File:
PDF, 85 KB
english, 1986
100

Quantitative evaluation of terrace width distributions from LEED measurements

Year:
1986
Language:
english
File:
PDF, 45 KB
english, 1986