A new method for evaluating postacne scarring
Jin Woong Lee, Beom Joon Kim, Myeung Nam Kim, Young-Hwan Choi, Kyungrok Kim, Eenjun HwangVolume:
18
Year:
2012
Language:
english
Pages:
1
DOI:
10.1111/j.1600-0846.2011.00568.x
File:
PDF, 179 KB
english, 2012