Mapping and Quantitative Trait Loci Analysis of Verticillium Wilt Resistance Genes in Cotton
Hong-Mei Wang, Zhong-Xu Lin, Xian-Long Zhang, Wei Chen, Xiao-Ping Guo, Yi-Chun Nie, Yun-Hai LiVolume:
50
Year:
2008
Language:
english
Pages:
9
DOI:
10.1111/j.1744-7909.2007.00612.x
File:
PDF, 715 KB
english, 2008