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New ID-TIMS, ICP-MS and SIMS Data on the Trace Element Composition and Homogeneity of NIST Certified Reference Material SRM 610-611
Alexander Rocholl, Peter Dulski, Ingrid RaczekVolume:
24
Year:
2000
Pages:
14
DOI:
10.1111/j.1751-908x.2000.tb00778.x
File:
PDF, 425 KB
2000