Determination of Multiple Trace Element Compositions in Thin (> 30 μm) Layers of NIST SRM 614 and 616 Using Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry (LA-ICP-MS)
Tomoaki Morishita, Yoshito Ishida, Shoji Arai, Miki ShirasakaVolume:
29
Year:
2005
Pages:
16
DOI:
10.1111/j.1751-908x.2005.tb00659.x
File:
PDF, 491 KB
2005