High Sensitivity Analysis of Trace Element-Poor Geological...

High Sensitivity Analysis of Trace Element-Poor Geological Reference Glasses by Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry (LA-ICP-MS)

Dorrit E. Jacob
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Volume:
30
Year:
2006
Pages:
15
DOI:
10.1111/j.1751-908x.2006.tb01064.x
File:
PDF, 450 KB
2006
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