![](/img/cover-not-exists.png)
Diffuse reflectance near-infrared spectroscopy as a nondestructive analytical technique for polymer implants
Ronald L. Brashear, Douglas R. Flanagan, Paul E. Luner, Jeffery J. Seyer, Mark S. KemperVolume:
88
Year:
1999
Language:
english
Pages:
6
DOI:
10.1021/js9804821
File:
PDF, 88 KB
english, 1999