Sampling of Sub-micron Particles for Electron Microscopy

Sampling of Sub-micron Particles for Electron Microscopy

BILLINGS, C. E., MEGAW, W. J., WIFFEN, R. D.
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Volume:
189
Pages:
1
DOI:
10.1038/189336a0
Date:
January, 1961
File:
PDF, 416 KB
1961
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