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Identification of a proline residue as a transduction element involved in voltage gating of gap junctions
Suchyna, Thomas M., Xu, Lie Xian, Gao, Feng, Fourtner, Charles R., Nicholson, Bruce J.Volume:
365
Year:
1993
Pages:
3
DOI:
10.1038/365847a0
File:
PDF, 515 KB
1993