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A crystal structure determined with 0.02 Å accuracy by electron microscopy
Weirich, Thomas E., Ramlau, Reiner, Simon, Arndt, Hovmöller, Sven, Zou, XiaodongVolume:
382
Year:
1996
Pages:
3
DOI:
10.1038/382144a0
File:
PDF, 1.06 MB
1996