Optical frequency metrology

Nature 2002 Vol. 416; Iss. 6877

Optical frequency metrology

Udem, Th., Holzwarth, R., Hänsch, T. W.
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Volume:
416
Year:
2002
Language:
english
Pages:
5
DOI:
10.1038/416233a
File:
PDF, 297 KB
english, 2002
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