‘Designer atoms’ for quantum metrology

‘Designer atoms’ for quantum metrology

Roos, C. F., Chwalla, M., Kim, K., Riebe, M., Blatt, R.
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Volume:
443
Year:
2006
Language:
english
Pages:
4
DOI:
10.1038/nature05101
File:
PDF, 278 KB
english, 2006
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