Atom-chip-based generation of entanglement for quantum metrology
Riedel, Max F., Böhi, Pascal, Li, Yun, Hänsch, Theodor W., Sinatra, Alice, Treutlein, PhilippVolume:
464
Year:
2010
Language:
english
Pages:
4
DOI:
10.1038/nature08988
File:
PDF, 385 KB
english, 2010