Measurement of the mechanical behavior of yeast membrane sensors using single-molecule atomic force microscopy
Heinisch, Jürgen J, Dupres, Vincent, Alsteens, David, Dufrêne, Yves FVolume:
5
Year:
2010
Language:
english
Pages:
8
DOI:
10.1038/nprot.2010.19
File:
PDF, 721 KB
english, 2010