Fast protocol validation by the combination of process inspection and global inspection
Yasushi Wakahara, Fumio Nitta, Eiji Utsunomiya, Toshikane Oda, Hironori SaitoVolume:
83
Year:
2000
Language:
english
Pages:
14
DOI:
10.1002/(sici)1520-6424(200007)83:73.0.co;2-x
File:
PDF, 441 KB
english, 2000