A method for evaluating the densities and energy levels of...

A method for evaluating the densities and energy levels of impurities in semiconductors from the temperature dependence of majority-carrier concentration

Hideharu Matsuura, Kazuhide Sonoi
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Volume:
80
Year:
1997
Pages:
6
DOI:
10.1002/(sici)1520-6432(199710)80:103.0.co;2-o
File:
PDF, 612 KB
1997
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