Electronics and Communications in Japan (Part III: Fundamental Electronic Science))
1998 Vol. 81; Iss. 4
![](/img/cover-not-exists.png)
Software reliability growth models incorporating imperfect debugging with introduced faults
Shigeru YamadaVolume:
81
Year:
1998
Pages:
9
DOI:
10.1002/(sici)1520-6440(199804)81:43.0.co;2-4
File:
PDF, 931 KB
1998