A concentration index for analyzing three-dimensional line...

Electronics and Communications in Japan (Part III: Fundamental Electronic Science)) 1998 Vol. 81; Iss. 7

A concentration index for analyzing three-dimensional line patterns and its application to X-ray CT images

Yoshito Mekada, Yasushi Hirano, Jun-ichi Hasegawa, Jun-ichiro Toriwaki
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Volume:
81
Year:
1998
Language:
english
Pages:
11
DOI:
10.1002/(sici)1520-6440(199807)81:73.0.co;2-i
File:
PDF, 383 KB
english, 1998
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