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Tilt test alters accuracy of the oscillometric device Omron HEM-705CP
Czarkowski, M, Mikulska, M, Żebrowski, M, Baran, A, Różanowski, KVolume:
18
Year:
2004
Language:
english
Pages:
2
DOI:
10.1038/sj.jhh.1001667
File:
PDF, 53 KB
english, 2004