On the reliability of a dental OSCE, using SEM: effect of different days
M. Schoonheim-Klein, A. Muijtens, L. Habets, M. Manogue, C. Van der Vleuten, J. Hoogstraten, U. Van der VeldenVolume:
12
Year:
2008
Language:
english
Pages:
7
DOI:
10.1111/j.1600-0579.2008.00507.x
File:
PDF, 77 KB
english, 2008