Measurement of the thermal properties of thin dielectric films by a probe technique with periodic heating. I. Theory underlying the method
S. N. Kravchun, S. T. Davitadze, N. S. Mizina, B. A. StrukovVolume:
39
Language:
english
Pages:
6
DOI:
10.1134/1.1129912
Date:
April, 1997
File:
PDF, 166 KB
english, 1997