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Raman scattering spectra and electrical conductivity of thin silicon films with a mixed amorphous-nanocrystalline phase composition: Determination of the nanocrystalline volume fraction
V. G. Golubev, V. Yu. Davydov, A. V. Medvedev, A. B. Pevtsov, N. A. FeoktistovVolume:
39
Language:
english
Pages:
5
DOI:
10.1134/1.1130042
Date:
August, 1997
File:
PDF, 88 KB
english, 1997