Investigation of the chemical state of copper in Cu/SiO2composite films by x-ray photoelectron spectroscopy
S. A. Gurevich, T. A. Zaraiskaya, S. G. Konnikov, V. M. Mikushkin, S. Yu. Nikonov, A. A. Sitnikova, S. E. Sysoev, V. V. Khorenko, V. V. Shnitov, Yu. S. GordeevVolume:
39
Language:
english
Pages:
5
DOI:
10.1134/1.1130141
Date:
October, 1997
File:
PDF, 4.26 MB
english, 1997