Relation between the optoelectronic parameters of amorphous hydrogenated silicon films deposited at high temperatures and their microstructure
G. J. Adriaenssens, W. Grevendonk, O. A. GolikovaVolume:
32
Language:
english
Pages:
3
DOI:
10.1134/1.1187372
Date:
January, 1998
File:
PDF, 46 KB
english, 1998