X-Ray diffraction analysis of multilayer InAs-GaAs...

Semiconductors 1999 / 11 Vol. 33; Iss. 11

X-Ray diffraction analysis of multilayer InAs-GaAs heterostructures with InAs quantum dots

N. N. Faleev, A. Yu. Egorov, A. E. Zhukov, A. R. Kovsh, S. S. Mikhrin, V. M. Ustinov, K. M. Pavlov, V. I. Punegov, M. Tabuchi, Y. Takeda
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Volume:
33
Language:
english
Pages:
9
DOI:
10.1134/1.1187855
Date:
November, 1999
File:
PDF, 540 KB
english, 1999
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