High resolution x-ray diffractometry of the structural...

Technical Physics 1999 / 02 Vol. 44; Iss. 2

High resolution x-ray diffractometry of the structural characteristics of a semiconducting (InGa)As/GaAs superlattice

Ya. I. Nesterets, V. I. Punegov, K. M. Pavlov, N. N. Faleev
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Volume:
44
Language:
english
Pages:
9
DOI:
10.1134/1.1259279
Date:
February, 1999
File:
PDF, 21.54 MB
english, 1999
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