Field ion and scanning tunnel microscopy studies of surface...

Technical Physics 2000 / 03 Vol. 45; Iss. 3

Field ion and scanning tunnel microscopy studies of surface and bulk defects in carbon and silicon

A. L. Suvorov, Yu. N. Cheblukov, N. E. Lazarev, A. F. Bobkov, M. O. Popov, V. P. Babaev
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Volume:
45
Language:
english
Pages:
6
DOI:
10.1134/1.1259629
Date:
March, 2000
File:
PDF, 939 KB
english, 2000
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