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Oxygen-containing radiation defects in Si1−xGex
Yu. V. Pomozov, M. G. Sosnin, L. I. Khirunenko, V. I. Yashnik, N. V. Abrosimov, W. Schröder, M. HöhneVolume:
34
Language:
english
Pages:
5
DOI:
10.1134/1.1309399
Date:
September, 2000
File:
PDF, 76 KB
english, 2000