Electric field affects the charge state in ion-implanted Si-SiO2structures
A. P. Baraban, L. V. Miloglyadova, V. I. Ter-NersesyantsVolume:
27
Language:
english
Pages:
3
DOI:
10.1134/1.1352770
Date:
February, 2001
File:
PDF, 42 KB
english, 2001