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X-ray spectroscopic study of electronic structure of amorphous silicon and silicyne
A. I. Mashin, A. F. Khokhlov, É. P. Domashevskaya, V. A. Terekhov, N. I. MashinVolume:
35
Language:
english
Pages:
6
DOI:
10.1134/1.1393035
Date:
August, 2001
File:
PDF, 161 KB
english, 2001