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Structural characterization of Si1 −xGexultrathin quantum wells in a Si matrix by high-resolution X-ray diffraction
A. M. Afanas’ev, M. A. Chuev, R. M. Imamov, É. Kh. Mukhamedzhanov, M. M. Rzaev, F. Schäffler, M. MüehlbergerVolume:
47
Language:
english
Pages:
5
DOI:
10.1134/1.1523527
Date:
November, 2002
File:
PDF, 68 KB
english, 2002