Specific features of determination of the concentrations of shallow-level impurities in semiconductors from analysis of edge-luminescence spectra
K. D. Glinchuk, A. V. ProkhorovichVolume:
37
Language:
english
Pages:
8
DOI:
10.1134/1.1548655
Date:
February, 2003
File:
PDF, 105 KB
english, 2003