ESR studies of nanocrystalline silicon films obtained by...

Semiconductors 2004 / 05 Vol. 38; Iss. 5

ESR studies of nanocrystalline silicon films obtained by pulsed laser ablation of silicon targets

V. Ya. Bratus, S. M. Okulov, É. B. Kaganovich, I. M. Kizyak, É. G. Manoilov
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Volume:
38
Language:
english
Pages:
5
DOI:
10.1134/1.1755899
Date:
May, 2004
File:
PDF, 65 KB
english, 2004
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