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A noncontact method to study the charge state of the semiconductor-insulator interface
V. V. Kryachko, M. N. Levin, A. V. Tatarintsev, E. N. BormontovVolume:
49
Language:
english
Pages:
6
DOI:
10.1134/1.1809714
Date:
October, 2004
File:
PDF, 171 KB
english, 2004