Observation of antiphase domains in CdxHg1−xTe films on...

JETP Letters 2005 / 09 Vol. 82; Iss. 5

Observation of antiphase domains in CdxHg1−xTe films on silicon by the phase contrast method in atomic force microscopy

I. V. Sabinina, A. K. Gutakovskii, Yu. G. Sidorov, M. V. Yakushev, V. S. Varavin, A. V. Latyshev
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Volume:
82
Language:
english
Pages:
5
DOI:
10.1134/1.2130915
Date:
September, 2005
File:
PDF, 610 KB
english, 2005
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