Application of electron microscopy and x-ray structural...

Application of electron microscopy and x-ray structural analysis for the determination of sizes of structural elements in nanocrystalline materials (Review)

Yu. D. Yagodkin, S. V. Dobatkin
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Volume:
44
Language:
english
Pages:
11
DOI:
10.1134/s0020168508140070
Date:
December, 2008
File:
PDF, 649 KB
english, 2008
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