X-ray reflectometry of nanocomposite metal-dielectric films

X-ray reflectometry of nanocomposite metal-dielectric films

A. P. Petrakov, L. N. Kotov, Yu. E. Kalinin, A. V. Sitnikov
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Volume:
45
Language:
english
Pages:
3
DOI:
10.1134/s0020168509140258
Date:
December, 2009
File:
PDF, 166 KB
english, 2009
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