X-ray diffraction characterization and electrical...

X-ray diffraction characterization and electrical properties of TlIn1 −xGaxTe2crystals

E. M. Gojaev, E. A. Allakhyarov, E. M. Mamedov, S. S. Osmanova, A. M. Nazarov
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Volume:
46
Language:
english
Pages:
4
DOI:
10.1134/s002016851007006x
Date:
July, 2010
File:
PDF, 232 KB
english, 2010
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