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An automatic setup for measuring low-field temperature dependencies of magnetoresistances of film samples
P. D. Kim, D. L. Khalyapin, L. E. BykovaVolume:
50
Language:
english
Pages:
3
DOI:
10.1134/s0020441207040227
Date:
July, 2007
File:
PDF, 151 KB
english, 2007