Low-temperature conductance of the weak junction in InAs...

Low-temperature conductance of the weak junction in InAs nanowire in the field of AFM scanning gate

A. A. Zhukov, Ch. Volk, A. Winden, H. Hardtdegen, Th. Schäpers
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Volume:
93
Language:
english
Pages:
5
DOI:
10.1134/s0021364011010103
Date:
March, 2011
File:
PDF, 609 KB
english, 2011
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