![](/img/cover-not-exists.png)
Low-temperature conductance of the weak junction in InAs nanowire in the field of AFM scanning gate
A. A. Zhukov, Ch. Volk, A. Winden, H. Hardtdegen, Th. SchäpersVolume:
93
Language:
english
Pages:
5
DOI:
10.1134/s0021364011010103
Date:
March, 2011
File:
PDF, 609 KB
english, 2011