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XPS study of the oxidation of nanosize Ni/Si(100) films
É. P. Domashevskaya, S. V. Ryabtsev, V. A. Terekhov, A. S. Len’shin, F. M. Chernyshov, A. T. Kazakov, A. V. SidashovVolume:
52
Language:
english
Pages:
8
DOI:
10.1134/s002247661107016x
Date:
December, 2011
File:
PDF, 301 KB
english, 2011