Measuring the normalized jones matrix of anisotropic samples by means of static ellipsometry
V. A. Shvets, E. V. Spesivtsev, S. V. RykhlitskiĭVolume:
105
Language:
english
Pages:
6
DOI:
10.1134/s0030400x08100184
Date:
October, 2008
File:
PDF, 257 KB
english, 2008