X-ray diffraction study of the effect of annealing temperature on the phase and structural states of Fe79Zr10N11films produced by magnetron sputtering
E. N. Sheftel’, S. I. Utitskikh, A. N. Ivanov, M. Inoue, R. FujikawaVolume:
105
Language:
english
Pages:
6
DOI:
10.1134/s0031918x08050074
Date:
May, 2008
File:
PDF, 270 KB
english, 2008