Application of XAFS spectroscopy to studying the...

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques 2007 / 02 Vol. 1; Iss. 1

Application of XAFS spectroscopy to studying the microstructure and electronic structure of quantum dots

S. B. Erenburg, N. V. Bausk, A. V. Dvurechenskii, Zh. V. Smagina, A. V. Nenashev, A. I. Nikiforov, V. G. Mansurov, K. S. Zhuravlev, A. I. Toropov
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Volume:
1
Language:
english
Pages:
9
DOI:
10.1134/s1027451007010053
Date:
February, 2007
File:
PDF, 198 KB
english, 2007
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